Jack Crawford Day

The 30th Annual Jack Crawford Day - Advances That May Change Your Practice

This conference honours the late Dr. Jack S. Crawford, former Ophthalmologist-in-Chief for the Hospital for Sick Children, whose career was dedicated to advancing the specialty of paediatric ophthalmology and the care of children’s eye problems.

Conference Objectives

The 30th Annual Jack Crawford Day will focus on Advances That May Change Your Practice in Paediatric Ophthalmology.  The day will include topics relevant to both pediatric and general eye specialists including cross-linking news, orbital clues, understanding large scale studies, vision screening, glasses news, low vision upgrades, genetic testing and a few more.

We welcome international guest speakers including Dr. Daniel Mojon and Dr. Juan Pablo Lopez.

This overall goal of this program is to delve into technology and innovation in paediatric ophthalmology, providing attendees with a historical perspective and current trends in technology, practical tips for new diagnostic test and treatments, and a view toward future innovations.

At the conclusion of the meeting the attendee will:

Recognize how technology has changed paediatric ophthalmology practice over the past 20 years

Describe how to best utilize current technologies, including wide-field angiography, collagen cross-linking, telemedicine, and imaging technologies such as optical coherence tomography

Cite examples of innovative treatments, including gene therapy for retinal dystrophies, refractive surgery, and image-guided orbital surgery

Date:  Thursday, April 4, 2019

Location:  The Peter Gilgan Centre for Research and Learning, 686 Bay Street, Toronto, Ontario

Fees:

Allied Health Registration Fee - CAD $ 100.00
Discounted Price CAD $ 75.00 if registered by February 28, 2019

Optometrist/Ophthalmologist Registration Fee - CAD $ 200.00
Discounted Price CAD $ 175.00 if registered by February 28, 2019

SickKids Staff
Registration fees for SickKids Staff, Students and Trainees are complimentary

Registration Process
Online: Click Here